Yang, K.; Han, C.; Feng, J.; Tang, Y.; Xie, Z.; Hu, S.
Film Thickness-Profile Measurement Using Iterative Peak Separation Structured Illumination Microscopy. Appl. Sci. 2021, 11, 3023.
https://doi.org/10.3390/app11073023
AMA Style
Yang K, Han C, Feng J, Tang Y, Xie Z, Hu S.
Film Thickness-Profile Measurement Using Iterative Peak Separation Structured Illumination Microscopy. Applied Sciences. 2021; 11(7):3023.
https://doi.org/10.3390/app11073023
Chicago/Turabian Style
Yang, Kejun, Chenhaolei Han, Jinhua Feng, Yan Tang, Zhongye Xie, and Song Hu.
2021. "Film Thickness-Profile Measurement Using Iterative Peak Separation Structured Illumination Microscopy" Applied Sciences 11, no. 7: 3023.
https://doi.org/10.3390/app11073023
APA Style
Yang, K., Han, C., Feng, J., Tang, Y., Xie, Z., & Hu, S.
(2021). Film Thickness-Profile Measurement Using Iterative Peak Separation Structured Illumination Microscopy. Applied Sciences, 11(7), 3023.
https://doi.org/10.3390/app11073023