Nguyen, Q.;                     Shikina, T.;                     Teruya, D.;                     Hotta, S.;                     Han, H.-D.;                     Nakajo, H.    
        Leveraging Expert Knowledge for Label Noise Mitigation in Machine Learning. Appl. Sci. 2021, 11, 11040.
    https://doi.org/10.3390/app112211040
    AMA Style
    
                                Nguyen Q,                                 Shikina T,                                 Teruya D,                                 Hotta S,                                 Han H-D,                                 Nakajo H.        
                Leveraging Expert Knowledge for Label Noise Mitigation in Machine Learning. Applied Sciences. 2021; 11(22):11040.
        https://doi.org/10.3390/app112211040
    
    Chicago/Turabian Style
    
                                Nguyen, Quoc,                                 Tomoaki Shikina,                                 Daichi Teruya,                                 Seiji Hotta,                                 Huy-Dung Han,                                 and Hironori Nakajo.        
                2021. "Leveraging Expert Knowledge for Label Noise Mitigation in Machine Learning" Applied Sciences 11, no. 22: 11040.
        https://doi.org/10.3390/app112211040
    
    APA Style
    
                                Nguyen, Q.,                                 Shikina, T.,                                 Teruya, D.,                                 Hotta, S.,                                 Han, H.-D.,                                 & Nakajo, H.        
        
        (2021). Leveraging Expert Knowledge for Label Noise Mitigation in Machine Learning. Applied Sciences, 11(22), 11040.
        https://doi.org/10.3390/app112211040