Nguyen, Q.; Shikina, T.; Teruya, D.; Hotta, S.; Han, H.-D.; Nakajo, H.
Leveraging Expert Knowledge for Label Noise Mitigation in Machine Learning. Appl. Sci. 2021, 11, 11040.
https://doi.org/10.3390/app112211040
AMA Style
Nguyen Q, Shikina T, Teruya D, Hotta S, Han H-D, Nakajo H.
Leveraging Expert Knowledge for Label Noise Mitigation in Machine Learning. Applied Sciences. 2021; 11(22):11040.
https://doi.org/10.3390/app112211040
Chicago/Turabian Style
Nguyen, Quoc, Tomoaki Shikina, Daichi Teruya, Seiji Hotta, Huy-Dung Han, and Hironori Nakajo.
2021. "Leveraging Expert Knowledge for Label Noise Mitigation in Machine Learning" Applied Sciences 11, no. 22: 11040.
https://doi.org/10.3390/app112211040
APA Style
Nguyen, Q., Shikina, T., Teruya, D., Hotta, S., Han, H.-D., & Nakajo, H.
(2021). Leveraging Expert Knowledge for Label Noise Mitigation in Machine Learning. Applied Sciences, 11(22), 11040.
https://doi.org/10.3390/app112211040