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Journal: Appl. Sci., 2021
Volume: 11
Number: 7870

Article: Automated Defect Detection Using Threshold Value Classification Based on Thermographic Inspection
Authors: by Seungju Lee, Yoonjae Chung, Ranjit Shrestha and Wontae Kim
Link: https://www.mdpi.com/2076-3417/11/17/7870

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