Lei, C.-W.;                     Zhang, L.;                     Tai, T.-M.;                     Tsai, C.-C.;                     Hwang, W.-J.;                     Jhang, Y.-J.    
        Automated Surface Defect Inspection Based on Autoencoders and Fully Convolutional Neural Networks. Appl. Sci. 2021, 11, 7838.
    https://doi.org/10.3390/app11177838
    AMA Style
    
                                Lei C-W,                                 Zhang L,                                 Tai T-M,                                 Tsai C-C,                                 Hwang W-J,                                 Jhang Y-J.        
                Automated Surface Defect Inspection Based on Autoencoders and Fully Convolutional Neural Networks. Applied Sciences. 2021; 11(17):7838.
        https://doi.org/10.3390/app11177838
    
    Chicago/Turabian Style
    
                                Lei, Cheng-Wei,                                 Li Zhang,                                 Tsung-Ming Tai,                                 Chen-Chieh Tsai,                                 Wen-Jyi Hwang,                                 and Yun-Jie Jhang.        
                2021. "Automated Surface Defect Inspection Based on Autoencoders and Fully Convolutional Neural Networks" Applied Sciences 11, no. 17: 7838.
        https://doi.org/10.3390/app11177838
    
    APA Style
    
                                Lei, C.-W.,                                 Zhang, L.,                                 Tai, T.-M.,                                 Tsai, C.-C.,                                 Hwang, W.-J.,                                 & Jhang, Y.-J.        
        
        (2021). Automated Surface Defect Inspection Based on Autoencoders and Fully Convolutional Neural Networks. Applied Sciences, 11(17), 7838.
        https://doi.org/10.3390/app11177838