Lei, C.-W.; Zhang, L.; Tai, T.-M.; Tsai, C.-C.; Hwang, W.-J.; Jhang, Y.-J.
Automated Surface Defect Inspection Based on Autoencoders and Fully Convolutional Neural Networks. Appl. Sci. 2021, 11, 7838.
https://doi.org/10.3390/app11177838
AMA Style
Lei C-W, Zhang L, Tai T-M, Tsai C-C, Hwang W-J, Jhang Y-J.
Automated Surface Defect Inspection Based on Autoencoders and Fully Convolutional Neural Networks. Applied Sciences. 2021; 11(17):7838.
https://doi.org/10.3390/app11177838
Chicago/Turabian Style
Lei, Cheng-Wei, Li Zhang, Tsung-Ming Tai, Chen-Chieh Tsai, Wen-Jyi Hwang, and Yun-Jie Jhang.
2021. "Automated Surface Defect Inspection Based on Autoencoders and Fully Convolutional Neural Networks" Applied Sciences 11, no. 17: 7838.
https://doi.org/10.3390/app11177838
APA Style
Lei, C.-W., Zhang, L., Tai, T.-M., Tsai, C.-C., Hwang, W.-J., & Jhang, Y.-J.
(2021). Automated Surface Defect Inspection Based on Autoencoders and Fully Convolutional Neural Networks. Applied Sciences, 11(17), 7838.
https://doi.org/10.3390/app11177838