Improved Ensemble-Learning Algorithm for Predictive Maintenance in the Manufacturing Process
Abstract
:1. Introduction
1.1. Semiconductor Manufacturing Process
1.2. Scissor Product Packaging Machining Process
- Develop a new approach to improve the computation performance of boosted decision trees.
- Investigate the effect of ELAs and single models on manufacturing.
- Forecast yield failure in the semiconductor manufacturing process.
- Predict the package quality of the blister packing machine.
- Provide a prediagnostic suggestion for equipment configuration to improve work efficiency.
2. Current Trend of IIoT-Based PdM
3. IIoT-Based PdM-Related Studies
3.1. IIoT-Based PdM-Related Studies
3.2. Application of Ensemble Learning in Predictive Maintenance
4. Methodology
4.1. Data Preprocessing
- Step 1: exploring the minority class input data point.
- Step 2: finding the KNNs of the explored input data point.
- Step 3: select one of these neighbors’ point, and place a new point on the path connecting the point under consideration and its chosen neighbor.
- Step 4: Repeat Steps 1 and 2 until the termination condition is met (i.e., until the data are balanced).
4.2. Training Module
4.2.1. Decision Jungle
4.2.2. Boosted Decision Trees
4.2.3. Proposed Method: Adaptive Boosted Decision Trees
4.3. Module Deployment
5. Experiment
5.1. Case Data Description
5.2. Evaluation Criteria
5.2.1. Accuracy
5.2.2. Recall Rate (Sensitivity)
5.2.3. Receiver Operating Characteristic
5.2.4. Area under the ROC Curve
6. Result
6.1. Yield Failure Prediction in the Semiconductor Manufacturing Process
6.2. Quality Prediction of Scissor Product Packaging in Blister Packing Machining Process
7. Discussion
7.1. Potential of the Improved Ensemble-Learning Algorithm
7.2. Edge-Based Analytics and Fog-Based Analytics
8. Conclusions
8.1. Limitation of the Study
8.2. Future Study
Funding
Conflicts of Interest
References
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Year | Description |
---|---|
2016 | Gilchrist et al. presented IIoT potential applications, including data mining, predictive analytics, statistical approaches, and other application opportunities, to increase manufacturing productivity and efficiency [15]. |
2016 | Qin et al. implemented the Industry 4.0 framework with a multilayered framework and demonstrated how such an approach affects current manufacturing systems [16]. |
2017 | Jeschke et al. introduced future trends of cyber manufacturing systems and IIoT in Industry 4.0 [17]. |
2015 | Rose et al. reported that Industry 4.0 significantly affects corporate strategies and competition in many industries [18]. |
2017 | Thoben et al. provided an overview of smart manufacturing and Industry 4.0 and programs and analyzed the application potential of cyber–physical systems starting from the production process [19]. |
2017 | Chen et al. proposed the hierarchical architecture of a smart factory with three layers and discussed the significant problems and potential solutions to vital emerging technologies [20]. |
2018 | Tao et al. discussed that big data play a vital role in supporting smart manufacturing and proposed the conceptual framework for big data analytics [21]. |
2018 | Sisinni et al. highlighted the opportunities created by the challenges and potential of IIoT [22]. |
2016 | Bahrin et al. investigated the disciplinary distribution of emerging Industry 4.0-related topics [23]. |
2017 | Wan et al. proposed a big data solution for active preventive analytics in the manufacturing industry [24]. |
2019 | Frank et al. confirmed that Industry 4.0 is associated with front-end technologies, which comprise four parts: smart supply chain, smart working, smart manufacturing, and smart products [25]. |
2015 | Derhamy et al. introduced IoT development; IoT-related technologies are enabled to connect massive cyber–physical systems [26]. |
2018 | Ghobakhloo et al. surveyed current research on Industry 4.0 and provided a simple guide for the process of Industry 4.0 transition [27]. |
2016 | Arnold et al. surveyed the effect of IIoT on the current business model [28]. |
2017 | Li et al. provided a systemic overview of the industrial internet. They focused on applications, technologies, and existing challenges [29]. |
2017 | Mumtaz et al. referred to the standardization and development of cyber connectivity applications to achieve the goal of IIoT implementation [30]. |
2019 | Ben-Daya et al. surveyed the literature concerned with how IoT impacts supply chain management [31]. |
2017 | Ehret et al. argued that IIoT provides prospects and emerging business models for enterprises [32]. |
2017 | Civerchia et al. introduced the advanced IoT (IIoT) application and proposed a monitoring system for predictive maintenance manufacturing [33]. |
2017 | Maple et al. introduced the development of IoT, IoT-related definitions, and IoT-related application areas [34]. |
Predictive Maintenance Target | Manufacturing Type | Description | Instances |
---|---|---|---|
The yield of the manufacturing process | Semiconductor manufacturing process | The data have 591 features containing methods, classifications, and time stamps for each instance. | 1567 |
Packing quality of the product | Blister packing machine | The data have six attributes: heating time on the left side, heating time on the right side, coding time, pressure, and the packaging card type, and the packing cover type. | 17,836 |
AUC Range | Level of Discrimination |
---|---|
AUC = 0.5 | no discrimination |
0.7 ≤ AUC ≤ 0.8 | acceptable discrimination |
0.8 ≤ AUC ≤ 0.9 | excellent discrimination |
0.9 ≤ AUC ≤ 1.0 | outstanding discrimination |
Semiconductor Case | Blister Packing Machine Case | |
---|---|---|
Predictive Problem | The yield failure in the semiconductor manufacturing process. | The quality of scissor product packaging in the blister packing machining process. |
Type | Ensemble | Single | ||
---|---|---|---|---|
Algorithms | The Proposed Method | Boosted Decision tree | Decision Jungle | Decision Tree |
Accuracy | 0.974 | 0.966 | 0.941 | 0.952 |
Recall rate | 0.957 | 0.945 | 0.925 | 0.928 |
Type | Ensemble | Single | ||
---|---|---|---|---|
Algorithms | The Proposed Method | Boosted Decision tree | Decision Jungle | Decision Tree |
Accuracy | 0.992 | 0.991 | 0.992 | 0.987 |
Recall rate | 0.997 | 0.993 | 0.992 | 1 |
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Hung, Y.-H. Improved Ensemble-Learning Algorithm for Predictive Maintenance in the Manufacturing Process. Appl. Sci. 2021, 11, 6832. https://doi.org/10.3390/app11156832
Hung Y-H. Improved Ensemble-Learning Algorithm for Predictive Maintenance in the Manufacturing Process. Applied Sciences. 2021; 11(15):6832. https://doi.org/10.3390/app11156832
Chicago/Turabian StyleHung, Yu-Hsin. 2021. "Improved Ensemble-Learning Algorithm for Predictive Maintenance in the Manufacturing Process" Applied Sciences 11, no. 15: 6832. https://doi.org/10.3390/app11156832
APA StyleHung, Y.-H. (2021). Improved Ensemble-Learning Algorithm for Predictive Maintenance in the Manufacturing Process. Applied Sciences, 11(15), 6832. https://doi.org/10.3390/app11156832