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Open AccessArticle

Estimation of Thermal Resistance Field in Layered Materials by Analytical Asymptotic Method

1
Epsilon-Alcen, Esplanade des arts et métiers, 33405 Talence CEDEX, France
2
I2M UMR CNRS-ENSAM-UB 5295, Esplanade des arts et métiers, 33405 Talence CEDEX, France
3
National Research Tomsk Polytechnic University, Tomsk 634050, Russia
*
Author to whom correspondence should be addressed.
Appl. Sci. 2020, 10(7), 2351; https://doi.org/10.3390/app10072351
Received: 29 January 2020 / Revised: 10 March 2020 / Accepted: 10 March 2020 / Published: 30 March 2020
(This article belongs to the Special Issue Infrared Imaging and NDT)
In this paper, the problem of the quantitative characterization of thermal resistance fields in a multilayer sample is addressed by using the classical front face flash method as the thermal excitation and infrared thermography (IRT) as the monitoring sensor. In this challenging problem, the complete inverse processing of a multilayer analytical model is difficult due to the lack of sensitivity of some parameters (layer thickness, depth of thermal resistance, etc.) and the expansive computational iterative processing. For these reasons, the proposed strategy is to use a simple multilayer problem where only one resistive layer is estimated. Moreover, to simplify the inverse processing often based on iterative methods, an asymptotic development method is proposed here. Regarding the thermal signal reconstruction (TSR) methods, the drawback of these methods is the inability to be quantitative. To overcome this problem, the method incorporates a calibration process originating from the complete analytical quadrupole solution to the thermal problem. This analytical knowledge allows self-calibration of the asymptotic method. From this calibration, the quantitative thermal resistance field of a sample can be retrieved with a reasonable accuracy lower than 5%. View Full-Text
Keywords: thermal resistance estimation IR thermography; inverse processing thermal resistance estimation IR thermography; inverse processing
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MDPI and ACS Style

Groz, M.-M.; Bensalem, M.; Sommier, A.; Abisset-Chavanne, E.; Chevalier, S.; Chulkov, A.; Battaglia, J.-L.; Batsale, J.-C.; Pradere, C. Estimation of Thermal Resistance Field in Layered Materials by Analytical Asymptotic Method. Appl. Sci. 2020, 10, 2351. https://doi.org/10.3390/app10072351

AMA Style

Groz M-M, Bensalem M, Sommier A, Abisset-Chavanne E, Chevalier S, Chulkov A, Battaglia J-L, Batsale J-C, Pradere C. Estimation of Thermal Resistance Field in Layered Materials by Analytical Asymptotic Method. Applied Sciences. 2020; 10(7):2351. https://doi.org/10.3390/app10072351

Chicago/Turabian Style

Groz, Marie-Marthe; Bensalem, Mohamed; Sommier, Alain; Abisset-Chavanne, Emmanuelle; Chevalier, Stéphane; Chulkov, Arsenii; Battaglia, Jean-Luc; Batsale, Jean-Christophe; Pradere, Christophe. 2020. "Estimation of Thermal Resistance Field in Layered Materials by Analytical Asymptotic Method" Appl. Sci. 10, no. 7: 2351. https://doi.org/10.3390/app10072351

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