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Journal: Appl. Sci., 2020
Volume: 10
Number: 8110
Article:
Improvement of Microwave Electric Field Measurement Sensitivity via Multi-Carrier Modulation in Rydberg Atoms
Authors:
by
Shaohua Li, Jinpeng Yuan and Lirong Wang
Link:
https://www.mdpi.com/2076-3417/10/22/8110
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