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Journal: Appl. Sci., 2020
Volume: 10
Number: 8110

Article: Improvement of Microwave Electric Field Measurement Sensitivity via Multi-Carrier Modulation in Rydberg Atoms
Authors: by Shaohua Li, Jinpeng Yuan and Lirong Wang
Link: https://www.mdpi.com/2076-3417/10/22/8110

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