Bi, H.; Chen, Y.; Wu, Y.; Shi, Z.; Xia, J.; Yan, Q.
Residual Safety Margin-Based Risk Stratification for Hospital-Wide POCT Glucose Meters Anchored to ISO 15197: Moving Beyond Pass-Fail. Diagnostics 2025, 15, 3220.
https://doi.org/10.3390/diagnostics15243220
AMA Style
Bi H, Chen Y, Wu Y, Shi Z, Xia J, Yan Q.
Residual Safety Margin-Based Risk Stratification for Hospital-Wide POCT Glucose Meters Anchored to ISO 15197: Moving Beyond Pass-Fail. Diagnostics. 2025; 15(24):3220.
https://doi.org/10.3390/diagnostics15243220
Chicago/Turabian Style
Bi, Hao, Yuting Chen, Yihan Wu, Zuliang Shi, Jianbo Xia, and Qiuyue Yan.
2025. "Residual Safety Margin-Based Risk Stratification for Hospital-Wide POCT Glucose Meters Anchored to ISO 15197: Moving Beyond Pass-Fail" Diagnostics 15, no. 24: 3220.
https://doi.org/10.3390/diagnostics15243220
APA Style
Bi, H., Chen, Y., Wu, Y., Shi, Z., Xia, J., & Yan, Q.
(2025). Residual Safety Margin-Based Risk Stratification for Hospital-Wide POCT Glucose Meters Anchored to ISO 15197: Moving Beyond Pass-Fail. Diagnostics, 15(24), 3220.
https://doi.org/10.3390/diagnostics15243220