Jabas, A.; Abello Mercado, M.A.; Altmann, S.; Ringel, F.; Booz, C.; Kronfeld, A.; Sanner, A.P.; Brockmann, M.A.; Othman, A.E.
Single-Energy Metal Artifact Reduction (SEMAR) in Ultra-High-Resolution CT Angiography of Patients with Intracranial Implants. Diagnostics 2023, 13, 620.
https://doi.org/10.3390/diagnostics13040620
AMA Style
Jabas A, Abello Mercado MA, Altmann S, Ringel F, Booz C, Kronfeld A, Sanner AP, Brockmann MA, Othman AE.
Single-Energy Metal Artifact Reduction (SEMAR) in Ultra-High-Resolution CT Angiography of Patients with Intracranial Implants. Diagnostics. 2023; 13(4):620.
https://doi.org/10.3390/diagnostics13040620
Chicago/Turabian Style
Jabas, Abdullah, Mario Alberto Abello Mercado, Sebastian Altmann, Florian Ringel, Christian Booz, Andrea Kronfeld, Antoine P. Sanner, Marc A. Brockmann, and Ahmed E. Othman.
2023. "Single-Energy Metal Artifact Reduction (SEMAR) in Ultra-High-Resolution CT Angiography of Patients with Intracranial Implants" Diagnostics 13, no. 4: 620.
https://doi.org/10.3390/diagnostics13040620
APA Style
Jabas, A., Abello Mercado, M. A., Altmann, S., Ringel, F., Booz, C., Kronfeld, A., Sanner, A. P., Brockmann, M. A., & Othman, A. E.
(2023). Single-Energy Metal Artifact Reduction (SEMAR) in Ultra-High-Resolution CT Angiography of Patients with Intracranial Implants. Diagnostics, 13(4), 620.
https://doi.org/10.3390/diagnostics13040620
