Kim, S.; Choi, B.K.; Park, J.A.; Kim, H.J.; Oh, T.I.; Kang, W.S.; Kim, J.W.; Park, H.J.
Identification of Brain Damage after Seizures Using an MR-Based Electrical Conductivity Imaging Method. Diagnostics 2021, 11, 569.
https://doi.org/10.3390/diagnostics11030569
AMA Style
Kim S, Choi BK, Park JA, Kim HJ, Oh TI, Kang WS, Kim JW, Park HJ.
Identification of Brain Damage after Seizures Using an MR-Based Electrical Conductivity Imaging Method. Diagnostics. 2021; 11(3):569.
https://doi.org/10.3390/diagnostics11030569
Chicago/Turabian Style
Kim, Sanga, Bup Kyung Choi, Ji Ae Park, Hyung Joong Kim, Tong In Oh, Won Sub Kang, Jong Woo Kim, and Hae Jeong Park.
2021. "Identification of Brain Damage after Seizures Using an MR-Based Electrical Conductivity Imaging Method" Diagnostics 11, no. 3: 569.
https://doi.org/10.3390/diagnostics11030569
APA Style
Kim, S., Choi, B. K., Park, J. A., Kim, H. J., Oh, T. I., Kang, W. S., Kim, J. W., & Park, H. J.
(2021). Identification of Brain Damage after Seizures Using an MR-Based Electrical Conductivity Imaging Method. Diagnostics, 11(3), 569.
https://doi.org/10.3390/diagnostics11030569