Article Versions Notes

Wang H, Wei J, Lin B, Cui X, Hou H, Fu Z, Ding J, Sui T. Microwave Frequency Offset Induced by Subsurface Damage in Abrasive-Machined Semiconductor Ceramic Waveguide. Machines. 2023; 11(12):1057. https://doi.org/10.3390/machines11121057

Wang, Haoji, Jinhua Wei, Bin Lin, Xiaoqi Cui, Hetian Hou, Zhiyuan Fu, Jianchun Ding, and Tianyi Sui. 2023. "Microwave Frequency Offset Induced by Subsurface Damage in Abrasive-Machined Semiconductor Ceramic Waveguide" Machines 11, no. 12: 1057. https://doi.org/10.3390/machines11121057

Wang, H., Wei, J., Lin, B., Cui, X., Hou, H., Fu, Z., Ding, J., & Sui, T. (2023). Microwave Frequency Offset Induced by Subsurface Damage in Abrasive-Machined Semiconductor Ceramic Waveguide. Machines, 11(12), 1057. https://doi.org/10.3390/machines11121057