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Journal: Machines, 2022
Volume: 10
Number: 1194
Article:
Impacts of SiC-MOSFET Gate Oxide Degradation on Three-Phase Voltage and Current Source Inverters
Authors:
by
Jaechang Kim, Sangshin Kwak and Seungdeog Choi
Link:
https://www.mdpi.com/2075-1702/10/12/1194
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