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Open AccessArticle

Development of a Stress Sensor for In-Situ High-Pressure Deformation Experiments Using Radial X-ray Diffraction

Department of Geology and Geophysics, Yale University, New Haven, CT 06511, USA
Intel Ronler Acres Campus, 2501 NE Century Boulevard, Hillsboro, OR 97124, USA
Mineral Physics Institute, Stony Brook University, Stony Brook, NY 11794, USA
Author to whom correspondence should be addressed.
Minerals 2020, 10(2), 166;
Received: 30 December 2019 / Revised: 29 January 2020 / Accepted: 10 February 2020 / Published: 13 February 2020
(This article belongs to the Special Issue Mineral Physics—In Memory of Orson Anderson)
We developed a stress sensor for in-situ deformation experiments using synchrotron radial X-ray diffraction. This stress sensor provided nearly diffraction-plane-independent stress that, when used in series with a sample, reduced the uncertainty of the average stress estimation acting on a sample. Here, we present the results of a study where pyrope was used as a stress sensor. Using a Deformation-DIA (D-DIA) high-pressure deformation apparatus, pyrope, olivine and alumina were deformed in the same run/cell assembly placed in series along the compression direction. Deformation experiments were conducted at pressures between 4 and 5 GPa and temperatures between 730 and 1273 K with strain-rates between 10−5 and 10−6 s−1. Stresses estimated from various (hkl) planes in pyrope were nearly the same; i.e., pyrope is plastically isotropic with ≤10 % variation with (hkl). However, stresses from various (hkl) planes in olivine and alumina varied by approximately a factor of 3. Comparisons between average stresses inferred from pyrope and those from different diffraction planes in olivine and alumina showed that the average stress in these materials evolved from low-end stress, estimated from various (hkl) planes at small strain, to high-end stress at a large strain. This suggests that the rate-controlling slip system in these materials changes from the soft to the hard slip system with strain.
Keywords: high pressure; deformation; in-situ; D-DIA; stress sensor high pressure; deformation; in-situ; D-DIA; stress sensor
MDPI and ACS Style

Girard, J.; Silber, R.E.; Mohiuddin, A.; Chen, H.; Karato, S.-I. Development of a Stress Sensor for In-Situ High-Pressure Deformation Experiments Using Radial X-ray Diffraction. Minerals 2020, 10, 166.

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