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Journal: Genes, 2024
Volume: 15
Number: 583
Article:
Mapping of Leaf Rust Resistance Loci in Two Kenyan Wheats and Development of Linked Markers
Authors:
by
Davinder Singh, Peace Kankwatsa, Karanjeet S. Sandhu, Urmil K. Bansal, Kerrie L. Forrest and Robert F. Park
Link:
https://www.mdpi.com/2073-4425/15/5/583
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