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Journal: Genes, 2024
Volume: 15
Number: 583

Article: Mapping of Leaf Rust Resistance Loci in Two Kenyan Wheats and Development of Linked Markers
Authors: by Davinder Singh, Peace Kankwatsa, Karanjeet S. Sandhu, Urmil K. Bansal, Kerrie L. Forrest and Robert F. Park
Link: https://www.mdpi.com/2073-4425/15/5/583

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