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Journal: Agronomy, 2025
Volume: 15
Number: 2128
2128
Article: Uncovering the Genetic Basis of Grain Yield-Related Traits in Common Vetch (Vicia sativa L.) Through Genome-Wide Association Mapping
Authors: by Hui Jin, Jumei Zhang, Yordan Dimtrov, Xue Yang, Ruonan Du, Yu’e Wu, Danna Chang, Rui Zhang and Haibin Zhao
Link: https://www.mdpi.com/2073-4395/15/9/2128

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