Shi, K.; Zhang, D.; Wan, Z.; Chen, L.; Lu, Z.
Intrinsic Chemical Consequences of Interface Failure in Composite Insulators Under Electrical Stress: PD-Induced Degradation of Epoxy/Anhydride Matrix and the Role of Humidity. Polymers 2026, 18, 1556.
https://doi.org/10.3390/polym18131556
AMA Style
Shi K, Zhang D, Wan Z, Chen L, Lu Z.
Intrinsic Chemical Consequences of Interface Failure in Composite Insulators Under Electrical Stress: PD-Induced Degradation of Epoxy/Anhydride Matrix and the Role of Humidity. Polymers. 2026; 18(13):1556.
https://doi.org/10.3390/polym18131556
Chicago/Turabian Style
Shi, Kexin, Dandan Zhang, Zhiyu Wan, Lixue Chen, and Zhaohua Lu.
2026. "Intrinsic Chemical Consequences of Interface Failure in Composite Insulators Under Electrical Stress: PD-Induced Degradation of Epoxy/Anhydride Matrix and the Role of Humidity" Polymers 18, no. 13: 1556.
https://doi.org/10.3390/polym18131556
APA Style
Shi, K., Zhang, D., Wan, Z., Chen, L., & Lu, Z.
(2026). Intrinsic Chemical Consequences of Interface Failure in Composite Insulators Under Electrical Stress: PD-Induced Degradation of Epoxy/Anhydride Matrix and the Role of Humidity. Polymers, 18(13), 1556.
https://doi.org/10.3390/polym18131556