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Journal: Crystals, 2017
Volume: 7
Number: 177

Article: The Role of III-V Substrate Roughness and Deoxidation Induced by Digital Etch in Achieving Low Resistance Metal Contacts
Authors: by Florent Ravaux, Irfan Saadat and Mustapha Jouiad
Link: https://www.mdpi.com/2073-4352/7/6/177

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