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Crystals 2017, 7(6), 172;

Structural and Electrical Properties Characterization of Sb1.52Bi0.48Te3.0 Melt-Spun Ribbons

Institut Jean Lamour, UMR 7198 CNRS, Université de Lorraine, Parc de Saurupt, CS 50840, 54011 Nancy, France
C2TN, Instituto Superior Técnico, Universidade de Lisboa, Estrada Nacional 10, 2695-066 Bobadela LRS, Portugal
Author to whom correspondence should be addressed.
Academic Editor: George S. Nolas
Received: 28 April 2017 / Revised: 1 June 2017 / Accepted: 7 June 2017 / Published: 13 June 2017
(This article belongs to the Special Issue Materials Processing and Crystal Growth for Thermoelectrics)
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Melt-spinning (MS) has been reported as a promising tool to tailor the microstructure of bulk thermoelectric materials leading to enhanced thermoelectric performances. Here, we report on a detailed characterization of p-type Bi0.48Sb1.52Te3 ribbons produced by melt-spinning. The microstructure of the melt-spun ribbons has been studied by means of X-ray diffraction, scanning and transmission electron microscopy (TEM). The analyses indicate that the ribbons are highly-textured with a very good chemical homogeneity. TEM reveals clear differences in the microstructure at large and short-range scales between the surface that was in contact with the copper wheel and the free surface. These analyses further evidence the absence of amorphous regions in the melt-spun ribbons and the precipitation of elemental Te at the grain boundaries. Low-temperature electrical resistivity and thermopower measurements (20–300 K) carried out on several randomly-selected ribbons confirm the excellent reproducibility of the MS process. However, the comparison of the transport properties of the ribbons with those of bulk polycrystalline samples of the same initial composition shows that MS leads to a more pronounced metallic character. This difference is likely tied to changes in deviations from stoichiometry due to the out-of-equilibrium conditions imposed by MS. View Full-Text
Keywords: melt-spinning; microstructure; X-ray diffraction; transmission electron microscopy; electrical properties melt-spinning; microstructure; X-ray diffraction; transmission electron microscopy; electrical properties

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Ohorodniichuk, V.; Dauscher, A.; Branco Lopes, E.; Migot, S.; Candolfi, C.; Lenoir, B. Structural and Electrical Properties Characterization of Sb1.52Bi0.48Te3.0 Melt-Spun Ribbons. Crystals 2017, 7, 172.

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