Anisotropic Thermo-Elastic Modeling and Sensitivity Analysis of Edge-Defined Film-Fed Grown β-Ga2O3
Abstract
1. Introduction
2. Materials and Methods
2.1. Model Geometry and Dimensionality Justification
2.2. Crystal Axis to Model Coordinate Mapping
2.3. Governing Equations and Boundary Conditions
2.3.1. Heat Transfer
2.3.2. Mechanical Equilibrium
2.3.3. Dislocation Density Estimation
2.4. Justification for Neglecting Melt Convection
2.5. Numerical Implementation
2.6. Modeling Pipeline
LatinHypercube Sampling Design
- Controllable process parameters (2): (2073–2120 K) and (1850–1950 K).
- Material property uncertainty ranges (8): the elastic constants , , and and the CTE components , , and varied within ±20% of their experimental values; surface emissivity (0.45–0.65) and the Rosseland coefficient (2000–4000 m−1).
2.7. Model Training and Feature Importance
Model-Assisted Optimization
3. Results
3.1. Thermal-Stress Field
3.2. Model Performance and Sensitivity
3.3. Optimization and Process Map
4. Discussion
4.1. Physical Interpretation of the Sensitivity Hierarchy
4.2. Implications for EFG Process Engineering
4.3. Limitations and Uncertainty Quantification
4.4. Comparison with Experimental Data
4.5. Temperature-Dependent Elastic Properties and Slip-System Analysis
4.6. Comparison with Prior Work
4.7. Preliminary Three-Dimensional Axisymmetric Validation
5. Conclusions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
Abbreviations
| EFG | Edge-Defined Film-Fed Growth |
| CZ | Czochralski |
| OFZ | Optical Floating Zone |
| VB | Vertical Bridgman |
| HRXRD | High-Resolution X-ray Diffraction |
| FWHM | Full Width at Half Maximum |
| RMS | Root Mean Square |
| LHS | Latin Hypercube Sampling |
| RUS | Resonant Ultrasound Spectroscopy |
| CTE | Coefficient of Thermal Expansion |
| CRSS | Critical Resolved Shear Stress |
| EPD | Etch-Pit Density |
| RSS | Resolved Shear Stress |
| MAE | Mean Absolute Error |
| CV | Cross-Validation |
| RBF | Radial Basis Function |
References
- Higashiwaki, M. β-Ga2O3 material properties, growth technologies, and devices: A review. AAPPS Bull. 2022, 32, 3. [Google Scholar] [CrossRef] [Scilit]
- Kuramata, A.; Koshi, K.; Watanabe, S.; Yamaoka, Y.; Masui, T.; Yamakoshi, S. High-quality β-Ga2O3 single crystals grown by edge-defined film-fed growth. Jpn. J. Appl. Phys. 2016, 55, 1202A2. [Google Scholar] [CrossRef] [Scilit]
- Feng, G.; Li, S.; Tian, Y.; Qi, S.; Guo, D.; Tang, W. 2 in. bulk β-Ga2O3 single crystals grown by EFG method with high wafer-scale quality. ACS Omega 2024, 9, 22084–22089. [Google Scholar] [CrossRef] [Scilit] [PubMed]
- Igarashi, T.; Ueda, Y.; Koshi, K.; Sakaguchi, R.; Watanabe, S.; Yamakoshi, S.; Kuramata, A. Growth of 6 inch diameter β-Ga2O3 crystal by the vertical Bridgman method. Phys. Status Solidi B 2025, 262, 2400444. [Google Scholar] [CrossRef] [Scilit]
- Wu, D.; Xia, N.; Ma, K.; Wang, J.; Li, C.; Jin, Z.; Zhang, H.; Yang, D. Numerical simulation of β-Ga2O3 single crystal growth by Czochralski method with an insulation lid. Crystals 2022, 12, 1715. [Google Scholar] [CrossRef] [Scilit]
- Yao, Y.; Ishikawa, Y.; Sugawara, Y. Revelation of dislocations in β-Ga2O3 substrates grown by edge-defined film-fed growth. Phys. Status Solidi A 2020, 217, 1900630. [Google Scholar] [CrossRef] [Scilit]
- Yan, Y.; Wu, D.; Xia, N.; Deng, T.; Zhang, H.; Yang, D. Anisotropic thermal expansion tensor of β-Ga2O3 and its critical role in casting-grown crystal cracking. Appl. Phys. Lett. 2024, 124, 122102. [Google Scholar] [CrossRef] [Scilit]
- Wang, J.; Li, Z.; Qi, C.; Liu, L. 3D numerical modeling and simulation of β-Ga2O3 crystal growth by edge-defined film-fed growth method. J. Vac. Sci. Technol. A 2025, 43, 013202. [Google Scholar] [CrossRef] [Scilit]
- Yin, C.; Meng, B.; Zhao, S.; Yan, Y.; Wang, Q.; Wu, G.; Liang, K.; Li, Z.; Jia, Z.; Wei, Q.; et al. Multiphysical field full-process simulation of gallium oxide with EFG approach. J. Am. Ceram. Soc. 2025, 108, e20421. [Google Scholar] [CrossRef] [Scilit]
- Jeong, W.H.; Choi, S.M.; Lim, S.M.; Shin, Y.J.; Bae, S.Y.; Kang, J.-K.; Lee, W.-J.; Kwon, S.-H.; Jeong, S.-M. Influence of active afterheater in the crystal growth of gallium oxide via edge-defined film-fed growing method. Crystals 2023, 13, 1591. [Google Scholar] [CrossRef] [Scilit]
- Stelian, C.; Muzy, J.; Labor, S.; Fivel, M.; Cabane, H.; Duffar, T. Numerical analysis of thermal stress in semi-transparent oxide crystals grown by Czochralski and EFG methods. Cryst. Res. Technol. 2018, 54, 1800219. [Google Scholar] [CrossRef] [Scilit]
- Yin, C.; Wan, X.; Yu, W.; Lu, Y.; Feng, J.; Liu, T.; Zhao, S.; Liang, K.; Wei, Q.; Guo, Y. Explainable analysis and optimization of the thermal field in gallium oxide single crystal growth based on machine learning. Cryst. Growth Des. 2026, 26, 1197–1209. [Google Scholar] [CrossRef] [Scilit]
- Kutsukake, K. Review of machine learning applications for crystal growth research. J. Cryst. Growth 2024, 630, 127598. [Google Scholar] [CrossRef] [Scilit]
- Miller, W.; Böttcher, K.; Galazka, Z.; Schreuer, J. Numerical modelling of the Czochralski growth of β-Ga2O3. Crystals 2017, 7, 26. [Google Scholar] [CrossRef] [Scilit]
- Mu, W.; Jia, Z.; Yin, Y.; Hu, Q.; Li, Y.; Wu, B.; Zhang, J.; Tao, X. High-quality crystal growth and anisotropic physical characterization of β-Ga2O3 single crystals grown by EFG method. J. Alloys Compd. 2017, 714, 453–458. [Google Scholar] [CrossRef] [Scilit]
- Yao, Y.; Ishikawa, Y.; Sugawara, Y. X-ray diffraction and Raman characterization of β-Ga2O3 single crystal grown by edge-defined film-fed growth method. J. Appl. Phys. 2019, 126, 205106. [Google Scholar] [CrossRef] [Scilit]
- Haven, D.; Moutinho, H.; Mangum, J.; Guthrey, H.; Joyce, D.; Zakutayev, A.; Haegel, N.M. Multimodal microscopy of extended defects in β-Ga2O3 (010) EFG crystals. AIP Adv. 2023, 13, 075122. [Google Scholar] [CrossRef] [Scilit]
- Li, P.; Bu, Y.; Chen, D.; Sai, Q.; Qi, H. Investigation of the crack extending downward along the seed of the β-Ga2O3 crystal grown by the EFG method. CrystEngComm 2021, 23, 6300–6306. [Google Scholar] [CrossRef] [Scilit]
- Wang, X.; Chang, X.; Wang, P.; Yang, X.; Yuan, L. Research progress and prospect of the bulk single crystal growth of β-Ga2O3: From 1964 to 2024. Cryst. Res. Technol. 2025, 60, 2400255. [Google Scholar] [CrossRef] [Scilit]
- Klimm, D.; Amgalan, B.; Ganschow, S.; Kwasniewski, A.; Galazka, Z.; Bickermann, M. The thermal conductivity tensor of β-Ga2O3 from 300 to 1275 K. Cryst. Res. Technol. 2023, 58, 2200204. [Google Scholar] [CrossRef] [Scilit]
- Adachi, K.; Ogi, H.; Takeuchi, N.; Nakamura, N.; Watanabe, H.; Ito, T.; Ozaki, Y. Unusual elasticity of monoclinic β-Ga2O3. J. Appl. Phys. 2018, 124, 085102. [Google Scholar] [CrossRef] [Scilit]
- Grundmann, M. The principal axes systems for the elastic properties of monoclinic gallia. Sci. Rep. 2020, 10, 19486. [Google Scholar] [CrossRef] [Scilit] [PubMed]
- Poncé, S.; Giustino, F. Structural, electronic, elastic, power, and transport properties of β-Ga2O3 from first principles. Phys. Rev. Res. 2020, 2, 033102. [Google Scholar] [CrossRef] [Scilit]
- Friedman, J. Greedy function approximation: A gradient boosting machine. Ann. Stat. 2001, 29, 1189–1232. [Google Scholar] [CrossRef] [Scilit]
- McKay, M.; Beckman, R.; Conover, W. A comparison of three methods for selecting values of input variables in the analysis of output from a computer code. Technometrics 1979, 21, 239–245. [Google Scholar] [CrossRef] [Scilit]
- Chen, T.; Guestrin, C. XGBoost: A scalable tree boosting system. In Proceedings of the 22nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, San Francisco, CA, USA, 13–17 August 2016; pp. 785–794. [Google Scholar] [CrossRef] [Scilit]
- Epure, S.; Braescu, L.; Balint, S. Modeling the effects of the vertical temperature gradient in the furnace in an edge-defined film-fed growth technique. Mater. Sci. Eng. B 2006, 134, 277–281. [Google Scholar] [CrossRef] [Scilit]
- Galazka, Z. Growth of bulk β-Ga2O3 single crystals by the Czochralski method. J. Appl. Phys. 2022, 131, 031103. [Google Scholar] [CrossRef] [Scilit]
- Liu, D.; Yan, Y.; Bi, Y.; Gao, X.; Zhu, Q.; Liu, Y.; Wu, D.; Jin, Z.; Xia, N.; Zhang, H.; et al. Temperature effects on anisotropic mechanical properties of cast-grown β-Ga2O3. J. Appl. Phys. 2025, 137, 125702. [Google Scholar] [CrossRef] [Scilit]
- Liu, D.; Wu, D.; Gao, X.; Bi, Y.; Yan, Y.; Liu, Y.; Jin, Z.; Xia, N.; Zhang, H.; Yang, D. Investigation of dislocation mobility on the cast-grown β-Ga2O3:(100) by nanoindentation. J. Alloys Compd. 2025, 1048, 185317. [Google Scholar] [CrossRef] [Scilit]
- Wu, D.; Yan, Y.; Sun, X.; Gao, X.; Liu, D.; Liu, Y.; Jin, Z.; Xia, N.; Zhang, H.; Yang, D. Characterization of dislocations in (10) β-Ga2O3 single crystal grown by the casting method. J. Alloys Compd. 2025, 1018, 179092. [Google Scholar] [CrossRef] [Scilit]
- Wu, Y.; Rao, Q.; Best, J.; Mu, D.; Xu, X.; Huang, H. Superior room temperature compressive plasticity of submicron beta-phase gallium oxide single crystals. Adv. Funct. Mater. 2022, 32, 2207960. [Google Scholar] [CrossRef] [Scilit]







| Ref. | Method | Dim. | Anisotropy | ML | Key Focus |
|---|---|---|---|---|---|
| Yin 2025 [9] | EFG | 2D | Iso. | – | Full-process simulation |
| Wang 2025 [8] | EFG | 3D | Ortho. | – | Dynamic interface tracking |
| Jeong 2023 [10] | EFG | 2D | Iso. | – | Afterheater effect |
| Stelian 2018 [11] | CZ/EFG | 2D | Iso. | – | Thermal stress comparison |
| Miller 2017 [14] | CZ | 2D | Iso. | – | Elastic & thermal props. |
| Yin 2026 [12] | EFG | 2D | Iso. | CatBoost | Explainable optimization |
| This work | EFG | 2D + 3D | Mono. | Gradient boosting | Full 21-comp. stiffness + surrogate |
| Parameter | Value | Description |
|---|---|---|
| 38 mm | Crucible inner radius | |
| 2 mm | Crucible wall thickness | |
| 120 mm | Crucible height | |
| 0.25 mm | Capillary slit half-width | |
| 1.5 mm | Die thickness | |
| 80 mm | Die height | |
| 25 mm | Crystal half-width | |
| 50 mm | Crystal height | |
| 2 mm | Meniscus height | |
| 20 mm | Die base elevation | |
| 40 mm | Afterheater height |
| Mesh | Elements | (MPa) | Rel. Error | |
|---|---|---|---|---|
| Coarse | 5 | ∼9500 | 223.0 | −0.13% |
| Medium | 4 | ∼15,000 | 223.3 | (reference) |
| Fine | 3 | ∼22,000 | 224.1 | +0.36% |
| Parameter | Lower | Upper | Nominal | Type |
|---|---|---|---|---|
| (K) | 2073 | 2120 | 2100 | Process |
| (K) | 1850 | 1950 | 1900 | Process |
| ( K−1) | 4.2 | 6.4 | 5.3 | Material |
| ( K−1) | 1.7 | 2.5 | 2.1 | Material |
| ( K−1) | 3.0 | 4.4 | 3.7 | Material |
| (GPa) | 128.0 | 192.0 | 160.0 | Material |
| (GPa) | 277.9 | 416.9 | 347.4 | Material |
| (GPa) | 218.5 | 267.1 | 242.8 | Material |
| 0.45 | 0.65 | 0.55 | Material | |
| (m−1) | 2000 | 4000 | 3000 | Material |
| Model | (Test) | MAE (MPa) | CV (5-Fold) |
|---|---|---|---|
| Gradient Boosting | 0.955 | 11.3 | |
| XGBoost | 0.968 | 6.72 | |
| Random Forest | 0.947 | 8.40 | |
| Gaussian Process | 0.99999 | 0.10 | N/A a |
| Rank | Parameter | Normalized Importance (%) | Type |
|---|---|---|---|
| 1 | 35.9 | Process | |
| 2 | 35.5 | Material | |
| 3 | 15.9 | Material | |
| 4 | 12.1 | Material | |
| 5 | 0.1 | Material | |
| 6–10 | Others | < | — |
| Parameter | Best LHS Sample | Nominal | Note |
|---|---|---|---|
| Process parameters | |||
| (K) | 1902 | 1900 | Mid-range |
| (K) | 2099 | 2100 | Mid-range |
| Material parameters | |||
| ( K−1) | 4.31 | 5.3 | Near lower bound |
| (GPa) | 289.1 | 347.4 | Near lower bound |
| (GPa) | 187.8 | 160.0 | Near upper bound |
| Outcome | Value | ||
| Nominal | 223 MPa | ||
| Process optimum (COMSOL-verified) | 159 MPa (up to 28.9% reduction) | ||
| Best LHS sample | 98.2 MPa | ||
| range | 98.2–452.2 MPa | ||
Disclaimer/Publisher’s Note: The statements, opinions and data contained in all publications are solely those of the individual author(s) and contributor(s) and not of MDPI and/or the editor(s). MDPI and/or the editor(s) disclaim responsibility for any injury to people or property resulting from any ideas, methods, instructions or products referred to in the content. |
© 2026 by the author. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license.
Share and Cite
Gao, X. Anisotropic Thermo-Elastic Modeling and Sensitivity Analysis of Edge-Defined Film-Fed Grown β-Ga2O3. Crystals 2026, 16, 558. https://doi.org/10.3390/cryst16090558
Gao X. Anisotropic Thermo-Elastic Modeling and Sensitivity Analysis of Edge-Defined Film-Fed Grown β-Ga2O3. Crystals. 2026; 16(9):558. https://doi.org/10.3390/cryst16090558
Chicago/Turabian StyleGao, Xingyou. 2026. "Anisotropic Thermo-Elastic Modeling and Sensitivity Analysis of Edge-Defined Film-Fed Grown β-Ga2O3" Crystals 16, no. 9: 558. https://doi.org/10.3390/cryst16090558
APA StyleGao, X. (2026). Anisotropic Thermo-Elastic Modeling and Sensitivity Analysis of Edge-Defined Film-Fed Grown β-Ga2O3. Crystals, 16(9), 558. https://doi.org/10.3390/cryst16090558

