Article Versions Notes

Gong T, Chen L, Wang X, Qiu Y, Liu H, Yang Z, Walther T. Recent Developments in Transmission Electron Microscopy for Crystallographic Characterization of Strained Semiconductor Heterostructures. Crystals. 2025; 15(2):192. https://doi.org/10.3390/cryst15020192

Gong, Tao, Longqing Chen, Xiaoyi Wang, Yang Qiu, Huiyun Liu, Zixing Yang, and Thomas Walther. 2025. "Recent Developments in Transmission Electron Microscopy for Crystallographic Characterization of Strained Semiconductor Heterostructures" Crystals 15, no. 2: 192. https://doi.org/10.3390/cryst15020192

Gong, T., Chen, L., Wang, X., Qiu, Y., Liu, H., Yang, Z., & Walther, T. (2025). Recent Developments in Transmission Electron Microscopy for Crystallographic Characterization of Strained Semiconductor Heterostructures. Crystals, 15(2), 192. https://doi.org/10.3390/cryst15020192