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Journal: Crystals, 2023
Volume: 13
Number: 693
Article:
Ellipsometry Characterisation for the Cd1-xZnxTe1-ySey Semiconductor Used in X-ray and Gamma Radiation Detectors
Authors:
by
Lidia MartÃnez Herraiz, Jose Luis Plaza Canga-argüelles and Alejandro Francisco Braña de Cal
Link:
https://www.mdpi.com/2073-4352/13/4/693
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