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Journal: Crystals, 2020
Volume: 10
Number: 691
Article:
Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti
Authors:
by
Bertalan Jóni, Éva Ódor, Mia Maric, Wolfgang Pantleon and Tamás Ungár
Link:
https://www.mdpi.com/2073-4352/10/8/691
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