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Journal: Crystals, 2020
Volume: 10
Number: 691

Article: Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti
Authors: by Bertalan Jóni, Éva Ódor, Mia Maric, Wolfgang Pantleon and Tamás Ungár
Link: https://www.mdpi.com/2073-4352/10/8/691

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