Jóni, B.; Ódor, É.; Maric, M.; Pantleon, W.; Ungár, T.
Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti. Crystals 2020, 10, 691.
https://doi.org/10.3390/cryst10080691
AMA Style
Jóni B, Ódor É, Maric M, Pantleon W, Ungár T.
Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti. Crystals. 2020; 10(8):691.
https://doi.org/10.3390/cryst10080691
Chicago/Turabian Style
Jóni, Bertalan, Éva Ódor, Mia Maric, Wolfgang Pantleon, and Tamás Ungár.
2020. "Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti" Crystals 10, no. 8: 691.
https://doi.org/10.3390/cryst10080691
APA Style
Jóni, B., Ódor, É., Maric, M., Pantleon, W., & Ungár, T.
(2020). Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti. Crystals, 10(8), 691.
https://doi.org/10.3390/cryst10080691