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Article

A Dynamic Physics-Guided Ensemble Model for Non-Intrusive Bond Wire Health Monitoring in IGBTs

1
College of Artificial Intelligence, Nanjing University of Posts and Telecommunications, Nanjing 210023, China
2
School of Information and Electronics, Beijing Institute of Technology, Beijing 100081, China
*
Authors to whom correspondence should be addressed.
These authors contributed equally to this work.
Micromachines 2026, 17(1), 70; https://doi.org/10.3390/mi17010070 (registering DOI)
Submission received: 10 December 2025 / Revised: 26 December 2025 / Accepted: 29 December 2025 / Published: 1 January 2026
(This article belongs to the Special Issue Insulated Gate Bipolar Transistor (IGBT) Modules, 2nd Edition)

Abstract

Bond wire degradation represents the predominant failure mechanism in IGBT modules, accounting for approximately 70% of power converter failures and posing significant reliability challenges in modern power electronic systems. Existing monitoring techniques face inherent trade-offs between measurement accuracy, implementation complexity, and electromagnetic compatibility. This paper proposes a physics-constrained ensemble learning framework for non-intrusive bond wire health assessment via Vce-on prediction. The methodological innovation lies in the synergistic integration of multidimensional feature engineering, adaptive ensemble fusion, and domain-informed regularization. A comprehensive 16-dimensional feature vector is constructed from multi-physical measurements, including electrical, thermal, and aging parameters, with novel interaction terms explicitly modeling electro-thermal stress coupling. A dynamic weighting mechanism then adaptively fuses three specialized gradient boosting models (CatBoost for high-current, LightGBM for thermal-stress, and XGBoost for late-life conditions) based on context-aware performance assessment. Finally, the meta-learner incorporates a physics-based regularization term that enforces fundamental semiconductor properties, ensuring thermodynamic consistency. Experimental validation demonstrates that the proposed framework achieves a mean absolute error of 0.0066 V and R2 of 0.9998 in predicting Vce-on, representing a 48.4% improvement over individual base models while maintaining 99.1% physical constraint compliance. These results establish a paradigm-shifting approach that harmonizes data-driven learning with physical principles, enabling accurate, robust, and practical health monitoring for next-generation power electronic systems.
Keywords: IGBT health monitoring; bond wire degradation; ensemble learning; physics-constrained machine learning IGBT health monitoring; bond wire degradation; ensemble learning; physics-constrained machine learning

Share and Cite

MDPI and ACS Style

Yang, X.; Hu, Z.; Bo, Y.; Shi, T.; Cui, M. A Dynamic Physics-Guided Ensemble Model for Non-Intrusive Bond Wire Health Monitoring in IGBTs. Micromachines 2026, 17, 70. https://doi.org/10.3390/mi17010070

AMA Style

Yang X, Hu Z, Bo Y, Shi T, Cui M. A Dynamic Physics-Guided Ensemble Model for Non-Intrusive Bond Wire Health Monitoring in IGBTs. Micromachines. 2026; 17(1):70. https://doi.org/10.3390/mi17010070

Chicago/Turabian Style

Yang, Xinyi, Zhen Hu, Yizhi Bo, Tao Shi, and Man Cui. 2026. "A Dynamic Physics-Guided Ensemble Model for Non-Intrusive Bond Wire Health Monitoring in IGBTs" Micromachines 17, no. 1: 70. https://doi.org/10.3390/mi17010070

APA Style

Yang, X., Hu, Z., Bo, Y., Shi, T., & Cui, M. (2026). A Dynamic Physics-Guided Ensemble Model for Non-Intrusive Bond Wire Health Monitoring in IGBTs. Micromachines, 17(1), 70. https://doi.org/10.3390/mi17010070

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