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Open AccessArticle
A Dynamic Physics-Guided Ensemble Model for Non-Intrusive Bond Wire Health Monitoring in IGBTs
by
Xinyi Yang
Xinyi Yang 1,†,
Zhen Hu
Zhen Hu 1,*,†
,
Yizhi Bo
Yizhi Bo 1,
Tao Shi
Tao Shi 1,*
and
Man Cui
Man Cui 2
1
College of Artificial Intelligence, Nanjing University of Posts and Telecommunications, Nanjing 210023, China
2
School of Information and Electronics, Beijing Institute of Technology, Beijing 100081, China
*
Authors to whom correspondence should be addressed.
†
These authors contributed equally to this work.
Micromachines 2026, 17(1), 70; https://doi.org/10.3390/mi17010070 (registering DOI)
Submission received: 10 December 2025
/
Revised: 26 December 2025
/
Accepted: 29 December 2025
/
Published: 1 January 2026
Abstract
Bond wire degradation represents the predominant failure mechanism in IGBT modules, accounting for approximately 70% of power converter failures and posing significant reliability challenges in modern power electronic systems. Existing monitoring techniques face inherent trade-offs between measurement accuracy, implementation complexity, and electromagnetic compatibility. This paper proposes a physics-constrained ensemble learning framework for non-intrusive bond wire health assessment via prediction. The methodological innovation lies in the synergistic integration of multidimensional feature engineering, adaptive ensemble fusion, and domain-informed regularization. A comprehensive 16-dimensional feature vector is constructed from multi-physical measurements, including electrical, thermal, and aging parameters, with novel interaction terms explicitly modeling electro-thermal stress coupling. A dynamic weighting mechanism then adaptively fuses three specialized gradient boosting models (CatBoost for high-current, LightGBM for thermal-stress, and XGBoost for late-life conditions) based on context-aware performance assessment. Finally, the meta-learner incorporates a physics-based regularization term that enforces fundamental semiconductor properties, ensuring thermodynamic consistency. Experimental validation demonstrates that the proposed framework achieves a mean absolute error of 0.0066 V and R2 of 0.9998 in predicting , representing a 48.4% improvement over individual base models while maintaining 99.1% physical constraint compliance. These results establish a paradigm-shifting approach that harmonizes data-driven learning with physical principles, enabling accurate, robust, and practical health monitoring for next-generation power electronic systems.
Share and Cite
MDPI and ACS Style
Yang, X.; Hu, Z.; Bo, Y.; Shi, T.; Cui, M.
A Dynamic Physics-Guided Ensemble Model for Non-Intrusive Bond Wire Health Monitoring in IGBTs. Micromachines 2026, 17, 70.
https://doi.org/10.3390/mi17010070
AMA Style
Yang X, Hu Z, Bo Y, Shi T, Cui M.
A Dynamic Physics-Guided Ensemble Model for Non-Intrusive Bond Wire Health Monitoring in IGBTs. Micromachines. 2026; 17(1):70.
https://doi.org/10.3390/mi17010070
Chicago/Turabian Style
Yang, Xinyi, Zhen Hu, Yizhi Bo, Tao Shi, and Man Cui.
2026. "A Dynamic Physics-Guided Ensemble Model for Non-Intrusive Bond Wire Health Monitoring in IGBTs" Micromachines 17, no. 1: 70.
https://doi.org/10.3390/mi17010070
APA Style
Yang, X., Hu, Z., Bo, Y., Shi, T., & Cui, M.
(2026). A Dynamic Physics-Guided Ensemble Model for Non-Intrusive Bond Wire Health Monitoring in IGBTs. Micromachines, 17(1), 70.
https://doi.org/10.3390/mi17010070
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