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Journal: Micromachines, 2026
Volume: 17
Number: 54
Article:
Radio-Frequency Characteristics of Stacked Metal–Insulator–Metal Capacitors in Radio-Frequency CMOS Devices
Authors:
by
Tae Min Choi, Hwa Rim Lee and Sung Gyu Pyo
Link:
https://www.mdpi.com/2072-666X/17/1/54
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