Chen, D.; Liu, X.; Yin, L.; Wang, Y.; Shi, Z.; Zhang, G.
A ΣΔ Closed-Loop Interface for a MEMS Accelerometer with Digital Built-In Self-Test Function. Micromachines 2018, 9, 444.
https://doi.org/10.3390/mi9090444
AMA Style
Chen D, Liu X, Yin L, Wang Y, Shi Z, Zhang G.
A ΣΔ Closed-Loop Interface for a MEMS Accelerometer with Digital Built-In Self-Test Function. Micromachines. 2018; 9(9):444.
https://doi.org/10.3390/mi9090444
Chicago/Turabian Style
Chen, Dongliang, Xiaowei Liu, Liang Yin, Yinhang Wang, Zhaohe Shi, and Guorui Zhang.
2018. "A ΣΔ Closed-Loop Interface for a MEMS Accelerometer with Digital Built-In Self-Test Function" Micromachines 9, no. 9: 444.
https://doi.org/10.3390/mi9090444
APA Style
Chen, D., Liu, X., Yin, L., Wang, Y., Shi, Z., & Zhang, G.
(2018). A ΣΔ Closed-Loop Interface for a MEMS Accelerometer with Digital Built-In Self-Test Function. Micromachines, 9(9), 444.
https://doi.org/10.3390/mi9090444