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Journal: Micromachines, 2026
Volume: 17
Number: 67

Article: YOLO-LA: Prototype-Based Vision–Language Alignment for Silicon Wafer Defect Pattern Detection
Authors: by Ziyue Wang, Yichen Yang, Jianning Chu, Yikai Zang, Zhongdi She, Weikang Fang and Ruoxin Wang
Link: https://www.mdpi.com/2072-666X/17/1/67

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