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Journal: Micromachines, 2025
Volume: 16
Number: 783

Article: The Impact of Single-Event Radiation on Latch-Up Effect in High-Temperature CMOS Devices and Its Mechanism
Authors: by Bin Wang, Jianguo Cui, Ling Lv and Longsheng Wu
Link: https://www.mdpi.com/2072-666X/16/7/783

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