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Journal: Micromachines, 2025
Volume: 16
Number: 417

Article: Research on Single-Event Effect Hardening Method of Transverse Split-Gate Trench Metal-Oxide-Semiconductor Field-Effect Transistors
Authors: by Mengtian Bao, Ying Wang, Jianqun Yang and Xingji Li
Link: https://www.mdpi.com/2072-666X/16/4/417

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