Butt, M.A.; Kozlowski, L.; Słowikowski, M.; Juchniewicz, M.; Drecka, D.; Filipiak, M.; Golas, M.; Stonio, B.; Dudek, M.; Piramidowicz, R.
Investigation of Modal Characteristics of Silicon Nitride Ridge Waveguides for Enhanced Refractive Index Sensing. Micromachines 2025, 16, 119.
https://doi.org/10.3390/mi16020119
AMA Style
Butt MA, Kozlowski L, Słowikowski M, Juchniewicz M, Drecka D, Filipiak M, Golas M, Stonio B, Dudek M, Piramidowicz R.
Investigation of Modal Characteristics of Silicon Nitride Ridge Waveguides for Enhanced Refractive Index Sensing. Micromachines. 2025; 16(2):119.
https://doi.org/10.3390/mi16020119
Chicago/Turabian Style
Butt, Muhammad A., Lukasz Kozlowski, Mateusz Słowikowski, Marcin Juchniewicz, Dagmara Drecka, Maciej Filipiak, Michał Golas, Bartłomiej Stonio, Michal Dudek, and Ryszard Piramidowicz.
2025. "Investigation of Modal Characteristics of Silicon Nitride Ridge Waveguides for Enhanced Refractive Index Sensing" Micromachines 16, no. 2: 119.
https://doi.org/10.3390/mi16020119
APA Style
Butt, M. A., Kozlowski, L., Słowikowski, M., Juchniewicz, M., Drecka, D., Filipiak, M., Golas, M., Stonio, B., Dudek, M., & Piramidowicz, R.
(2025). Investigation of Modal Characteristics of Silicon Nitride Ridge Waveguides for Enhanced Refractive Index Sensing. Micromachines, 16(2), 119.
https://doi.org/10.3390/mi16020119
