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Journal: Micromachines, 2025
Volume: 16
Number: 1091
Article:
Optimizing Annealing Temperature for Enhanced Electrical Performance and Stability of Solution-Processed In2O3 Thin-Film Transistors
Authors:
by
Taehui Kim, Seullee Lee, Ye-Won Lee, Dongwook Kim, Youngjun Yun, Jin-Hyuk Bae, Hyeonju Lee and Jaehoon Park
Link:
https://www.mdpi.com/2072-666X/16/10/1091
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