Kim, T.; Lee, S.; Lee, Y.-W.; Kim, D.; Yun, Y.; Bae, J.-H.; Lee, H.; Park, J.
Optimizing Annealing Temperature for Enhanced Electrical Performance and Stability of Solution-Processed In2O3 Thin-Film Transistors. Micromachines 2025, 16, 1091.
https://doi.org/10.3390/mi16101091
AMA Style
Kim T, Lee S, Lee Y-W, Kim D, Yun Y, Bae J-H, Lee H, Park J.
Optimizing Annealing Temperature for Enhanced Electrical Performance and Stability of Solution-Processed In2O3 Thin-Film Transistors. Micromachines. 2025; 16(10):1091.
https://doi.org/10.3390/mi16101091
Chicago/Turabian Style
Kim, Taehui, Seullee Lee, Ye-Won Lee, Dongwook Kim, Youngjun Yun, Jin-Hyuk Bae, Hyeonju Lee, and Jaehoon Park.
2025. "Optimizing Annealing Temperature for Enhanced Electrical Performance and Stability of Solution-Processed In2O3 Thin-Film Transistors" Micromachines 16, no. 10: 1091.
https://doi.org/10.3390/mi16101091
APA Style
Kim, T., Lee, S., Lee, Y.-W., Kim, D., Yun, Y., Bae, J.-H., Lee, H., & Park, J.
(2025). Optimizing Annealing Temperature for Enhanced Electrical Performance and Stability of Solution-Processed In2O3 Thin-Film Transistors. Micromachines, 16(10), 1091.
https://doi.org/10.3390/mi16101091