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Journal: Micromachines, 2025
Volume: 16
Number: 27
27
Article: Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors
Authors: by Snežana Djorić-Veljković, Emilija Živanović, Vojkan Davidović, Sandra Veljković, Nikola Mitrović, Goran Ristić, Albena Paskaleva, Dencho Spassov and Danijel Danković
Link: https://www.mdpi.com/2072-666X/16/1/27

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