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Journal: Micromachines, 2024
Volume: 15
Number: 872
872
Article: Positive Bias Temperature Instability in SiC-Based Power MOSFETs
Authors: by Vladislav Volosov, Santina Bevilacqua, Laura Anoldo, Giuseppe Tosto, Enzo Fontana, Alfio-lip Russo, Claudio Fiegna, Enrico Sangiorgi and Andrea Natale Tallarico
Link: https://www.mdpi.com/2072-666X/15/7/872

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