Avelar-Muñoz, F.; Gómez-Rosales, R.; Ortiz-Hernández, A.A.; Durán-Muñoz, H.; Berumen-Torres, J.A.; Vagas-Téllez, J.A.; Tototzintle-Huitle, H.; Méndez-GarcÃa, V.H.; Araiza, J.d.J.; Ortega-Sigala, J.J.
Long Electrical Stability on Dual Acceptor p-Type ZnO:Ag,N Thin Films. Micromachines 2024, 15, 800.
https://doi.org/10.3390/mi15060800
AMA Style
Avelar-Muñoz F, Gómez-Rosales R, Ortiz-Hernández AA, Durán-Muñoz H, Berumen-Torres JA, Vagas-Téllez JA, Tototzintle-Huitle H, Méndez-GarcÃa VH, Araiza JdJ, Ortega-Sigala JJ.
Long Electrical Stability on Dual Acceptor p-Type ZnO:Ag,N Thin Films. Micromachines. 2024; 15(6):800.
https://doi.org/10.3390/mi15060800
Chicago/Turabian Style
Avelar-Muñoz, Fernando, Roberto Gómez-Rosales, Arturo AgustÃn Ortiz-Hernández, Héctor Durán-Muñoz, Javier Alejandro Berumen-Torres, Jorge Alberto Vagas-Téllez, Hugo Tototzintle-Huitle, VÃctor Hugo Méndez-GarcÃa, José de Jesús Araiza, and José Juan Ortega-Sigala.
2024. "Long Electrical Stability on Dual Acceptor p-Type ZnO:Ag,N Thin Films" Micromachines 15, no. 6: 800.
https://doi.org/10.3390/mi15060800
APA Style
Avelar-Muñoz, F., Gómez-Rosales, R., Ortiz-Hernández, A. A., Durán-Muñoz, H., Berumen-Torres, J. A., Vagas-Téllez, J. A., Tototzintle-Huitle, H., Méndez-GarcÃa, V. H., Araiza, J. d. J., & Ortega-Sigala, J. J.
(2024). Long Electrical Stability on Dual Acceptor p-Type ZnO:Ag,N Thin Films. Micromachines, 15(6), 800.
https://doi.org/10.3390/mi15060800
