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Journal: Micromachines, 2024
Volume: 15
Number: 772

Article: A Comprehensive Analysis of Unclamped-Inductive-Switching-Induced Electrical Parameter Degradations and Optimizations for 4H-SiC Trench Metal-Oxide-Semiconductor Field-Effect Transistor Structures
Authors: by Li Liu, Jingqi Guo, Yiheng Shi, Kai Zeng and Gangpeng Li
Link: https://www.mdpi.com/2072-666X/15/6/772

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