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Journal: Micromachines, 2024
Volume: 15
Number: 561
561
Article: Reliability Study of Metal-Oxide Semiconductors in Integrated Circuits
Authors: by Boris V. Malozyomov, Nikita V. Martyushev, Natalia Nikolaevna Bryukhanova, Viktor V. Kondratiev, Roman V. Kononenko, Pavel P. Pavlov, Victoria V. Romanova and Yuliya I. Karlina
Link: https://www.mdpi.com/2072-666X/15/5/561

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