Malozyomov, B.V.; Martyushev, N.V.; Bryukhanova, N.N.; Kondratiev, V.V.; Kononenko, R.V.; Pavlov, P.P.; Romanova, V.V.; Karlina, Y.I.
Reliability Study of Metal-Oxide Semiconductors in Integrated Circuits. Micromachines 2024, 15, 561.
https://doi.org/10.3390/mi15050561
AMA Style
Malozyomov BV, Martyushev NV, Bryukhanova NN, Kondratiev VV, Kononenko RV, Pavlov PP, Romanova VV, Karlina YI.
Reliability Study of Metal-Oxide Semiconductors in Integrated Circuits. Micromachines. 2024; 15(5):561.
https://doi.org/10.3390/mi15050561
Chicago/Turabian Style
Malozyomov, Boris V., Nikita V. Martyushev, Natalia Nikolaevna Bryukhanova, Viktor V. Kondratiev, Roman V. Kononenko, Pavel P. Pavlov, Victoria V. Romanova, and Yuliya I. Karlina.
2024. "Reliability Study of Metal-Oxide Semiconductors in Integrated Circuits" Micromachines 15, no. 5: 561.
https://doi.org/10.3390/mi15050561
APA Style
Malozyomov, B. V., Martyushev, N. V., Bryukhanova, N. N., Kondratiev, V. V., Kononenko, R. V., Pavlov, P. P., Romanova, V. V., & Karlina, Y. I.
(2024). Reliability Study of Metal-Oxide Semiconductors in Integrated Circuits. Micromachines, 15(5), 561.
https://doi.org/10.3390/mi15050561