Cho, S.; Kim, S.; Kang, M.; Baik, S.; Jeon, J.
Analyzing Various Structural and Temperature Characteristics of Floating Gate Field Effect Transistors Applicable to Fine-Grain Logic-in-Memory Devices. Micromachines 2024, 15, 450.
https://doi.org/10.3390/mi15040450
AMA Style
Cho S, Kim S, Kang M, Baik S, Jeon J.
Analyzing Various Structural and Temperature Characteristics of Floating Gate Field Effect Transistors Applicable to Fine-Grain Logic-in-Memory Devices. Micromachines. 2024; 15(4):450.
https://doi.org/10.3390/mi15040450
Chicago/Turabian Style
Cho, Sangki, Sueyeon Kim, Myounggon Kang, Seungjae Baik, and Jongwook Jeon.
2024. "Analyzing Various Structural and Temperature Characteristics of Floating Gate Field Effect Transistors Applicable to Fine-Grain Logic-in-Memory Devices" Micromachines 15, no. 4: 450.
https://doi.org/10.3390/mi15040450
APA Style
Cho, S., Kim, S., Kang, M., Baik, S., & Jeon, J.
(2024). Analyzing Various Structural and Temperature Characteristics of Floating Gate Field Effect Transistors Applicable to Fine-Grain Logic-in-Memory Devices. Micromachines, 15(4), 450.
https://doi.org/10.3390/mi15040450