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Journal: Micromachines, 2024
Volume: 15
Number: 420
420
Article: Interaction of Negative Bias Instability and Self-Heating Effect on Threshold Voltage and SRAM (Static Random-Access Memory) Stability of Nanosheet Field-Effect Transistors
Authors: by Xiaoming Li, Yali Shao, Yunqi Wang, Fang Liu, Fengyu Kuang, Yiqi Zhuang and Cong Li
Link: https://www.mdpi.com/2072-666X/15/3/420

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