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Journal: Micromachines, 2024
Volume: 15
Number: 1343
1343
Article: High-Temperature Characterization of AlGaN Channel High Electron Mobility Transistor Based on Silicon Substrate
Authors: by Yinhe Wu, Xingchi Ma, Longyang Yu, Xin Feng, Shenglei Zhao, Weihang Zhang, Jincheng Zhang and Yue Hao
Link: https://www.mdpi.com/2072-666X/15/11/1343

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