Ruan, J.; Chen, L.; Zhou, L.; Du, X.; Wang, F.; Zhang, Y.; Zhao, P.; Ouyang, X.
Effects of 10 keV Electron Irradiation on the Performance Degradation of SiC Schottky Diode Radiation Detectors. Micromachines 2024, 15, 1331.
https://doi.org/10.3390/mi15111331
AMA Style
Ruan J, Chen L, Zhou L, Du X, Wang F, Zhang Y, Zhao P, Ouyang X.
Effects of 10 keV Electron Irradiation on the Performance Degradation of SiC Schottky Diode Radiation Detectors. Micromachines. 2024; 15(11):1331.
https://doi.org/10.3390/mi15111331
Chicago/Turabian Style
Ruan, Jinlu, Liang Chen, Leidang Zhou, Xue Du, Fangbao Wang, Yapeng Zhang, Penghui Zhao, and Xiaoping Ouyang.
2024. "Effects of 10 keV Electron Irradiation on the Performance Degradation of SiC Schottky Diode Radiation Detectors" Micromachines 15, no. 11: 1331.
https://doi.org/10.3390/mi15111331
APA Style
Ruan, J., Chen, L., Zhou, L., Du, X., Wang, F., Zhang, Y., Zhao, P., & Ouyang, X.
(2024). Effects of 10 keV Electron Irradiation on the Performance Degradation of SiC Schottky Diode Radiation Detectors. Micromachines, 15(11), 1331.
https://doi.org/10.3390/mi15111331