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Journal: Micromachines, 2023
Volume: 14
Number: 1469

Article: Investigation of the Degradation Mechanism of SiC MOSFET Subjected to Multiple Stresses
Authors: by Huifen Dong, Yunxia Wu, Chan Li and Hai Xu
Link: https://www.mdpi.com/2072-666X/14/7/1469

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