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Journal: Micromachines, 2023
Volume: 14
Number: 1180
Article:
Modeling and Validation of Total Ionizing Dose Effect on the TSVs in RF Microsystem
Authors:
by
Lihong Yang, Zhumeng Li, Guangbao Shan, Qijun Lu and Yu Fu
Link:
https://www.mdpi.com/2072-666X/14/6/1180
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