Article Versions Notes

Liu R, Gao L, Wang J, Ni T, Li Y, Wang R, Li D, Bu J, Zeng C, Li B, et al. Investigation of Anomalous Degradation Tendency of Low-Frequency Noise in Irradiated SOI-NMOSFETs. Micromachines. 2023; 14(3):602. https://doi.org/10.3390/mi14030602

Liu, Rui, Linchun Gao, Juanjuan Wang, Tao Ni, Yifan Li, Runjian Wang, Duoli Li, Jianhui Bu, Chuanbin Zeng, Bo Li, and et al. 2023. "Investigation of Anomalous Degradation Tendency of Low-Frequency Noise in Irradiated SOI-NMOSFETs" Micromachines 14, no. 3: 602. https://doi.org/10.3390/mi14030602

Liu, R., Gao, L., Wang, J., Ni, T., Li, Y., Wang, R., Li, D., Bu, J., Zeng, C., Li, B., & Luo, J. (2023). Investigation of Anomalous Degradation Tendency of Low-Frequency Noise in Irradiated SOI-NMOSFETs. Micromachines, 14(3), 602. https://doi.org/10.3390/mi14030602