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Investigation of the Connection Schemes between Decks in 3D NAND Flash
 
 

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Journal: Micromachines, 2023
Volume: 14
Number: 1916

Article: Investigation of Erase Cycling Induced Joint Dummy Cell Disturbance in Dual-Deck 3D NAND Flash Memory
Authors: by Kaikai You, Lei Jin, Jianquan Jia and Zongliang Huo
Link: https://www.mdpi.com/2072-666X/14/10/1916

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