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Journal: Micromachines, 2023
Volume: 14
Number: 1833
Article:
Reliability Assessment of On-Wafer AlGaN/GaN HEMTs: The Impact of Electric Field Stress on the Mean Time to Failure
Authors:
by
Surajit Chakraborty and Tae-Woo Kim
Link:
https://www.mdpi.com/2072-666X/14/10/1833
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