Wu, H.; Fu, X.; Luo, J.; Yang, M.; Yang, X.; Huang, W.; Zhang, H.; Xiang, F.; Pu, Y.; Wang, Z.
Total Ionizing Dose Effects on the Threshold Voltage of GaN Cascode Devices. Micromachines 2023, 14, 1832.
https://doi.org/10.3390/mi14101832
AMA Style
Wu H, Fu X, Luo J, Yang M, Yang X, Huang W, Zhang H, Xiang F, Pu Y, Wang Z.
Total Ionizing Dose Effects on the Threshold Voltage of GaN Cascode Devices. Micromachines. 2023; 14(10):1832.
https://doi.org/10.3390/mi14101832
Chicago/Turabian Style
Wu, Hao, Xiaojun Fu, Jun Luo, Manlin Yang, Xiaoyu Yang, Wei Huang, Huan Zhang, Fan Xiang, Yang Pu, and Ziwei Wang.
2023. "Total Ionizing Dose Effects on the Threshold Voltage of GaN Cascode Devices" Micromachines 14, no. 10: 1832.
https://doi.org/10.3390/mi14101832
APA Style
Wu, H., Fu, X., Luo, J., Yang, M., Yang, X., Huang, W., Zhang, H., Xiang, F., Pu, Y., & Wang, Z.
(2023). Total Ionizing Dose Effects on the Threshold Voltage of GaN Cascode Devices. Micromachines, 14(10), 1832.
https://doi.org/10.3390/mi14101832