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Journal: Micromachines, 2023
Volume: 14
Number: 79
79
Article: Effect of Acceptor Traps in GaN Buffer Layer on Breakdown Performance of AlGaN/GaN HEMTs
Authors: by Maodan Ma, Yanrong Cao, Hanghang Lv, Zhiheng Wang, Xinxiang Zhang, Chuan Chen, Linshan Wu, Ling Lv, Xuefeng Zheng, Wenchao Tian, Xiaohua Ma and Yue Hao
Link: https://www.mdpi.com/2072-666X/14/1/79

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