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Journal: Micromachines, 2022
Volume: 13
Number: 1476
Article:
Simulation Study: The Impact of Structural Variations on the Characteristics of a Buried-Channel-Array Transistor (BCAT) in DRAM
Authors:
by
Minjae Sun, Hyoung Won Baac and Changhwan Shin
Link:
https://www.mdpi.com/2072-666X/13/9/1476
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